Relative intensity noise (RIN)
The power spectral density of relative optical power fluctuations of a laser source, normalized to the average optical power. Units are 1/Hz, conventionally expressed in dB/Hz.
Relative intensity noise (RIN) characterizes the random fluctuations of a laser's output power, normalized so that the result is independent of absolute power level:
where is the average optical power and is the one-sided power spectral density of the power fluctuation . Units are 1/Hz; values are conventionally reported in dB/Hz as .
The RIN spectrum of a typical semiconductor laser shows characteristic frequency-dependent structure:
| Frequency range | Behavior |
|---|---|
| kHz | Elevated region (carrier and current noise) |
| 100 kHz to relaxation oscillation | Approximately flat floor |
| At relaxation oscillation frequency | Peak (carrier-photon resonance) |
| Above relaxation oscillation | Roll-off |
Typical floor RIN values:
| Source | Wavelength | Floor RIN |
|---|---|---|
| DFB telecom laser | 1310 / 1550 nm | to dB/Hz |
| Fabry–Pérot multi-mode laser | 1310 nm | to dB/Hz |
| VCSEL | 850 nm | to dB/Hz |
| Solid-state Nd:YAG | 1064 nm | to dB/Hz |
The shot-noise limit at detected DC photocurrent corresponds to a RIN floor of . For mA, this is dB/Hz; for higher detected currents the shot-noise floor decreases. Laser RIN is bounded below by the shot-noise limit for the chosen detection power.
RIN matters for analog optical links (where it sets the SNR floor independent of received power), for coherent communication (where it contributes to phase noise via amplitude-to-phase coupling), and for any system using lasers as a precision reference. Measurement procedure is in Relative Intensity Noise Measurement of Semiconductor Lasers.