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    <title>Photonica</title>
    <link>https://photonica.io</link>
    <description>Practical photonics engineering — tutorials, references, and tools.</description>
    <language>en-us</language>
    <lastBuildDate>Wed, 20 May 2026 00:00:00 GMT</lastBuildDate>
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      <title>Photodetector Characterization: Responsivity, NEP, and Bandwidth</title>
      <link>https://photonica.io/articles/photodetector-characterization</link>
      <guid isPermaLink="true">https://photonica.io/articles/photodetector-characterization</guid>
      <pubDate>Wed, 20 May 2026 00:00:00 GMT</pubDate>
      <description>Procedures for measuring the three primary parameters of photodetectors used in photonics — wavelength-dependent responsivity, noise-equivalent power, and 3-dB electrical bandwidth — with focus on the standard measurement configurations for InGaAs PIN photodiodes.</description>
      <category>Procedure · Detector characterization</category>
    </item>
    <item>
      <title>DFB Laser Characterization: Full Parameter Extraction Workflow</title>
      <link>https://photonica.io/articles/dfb-characterization-workflow</link>
      <guid isPermaLink="true">https://photonica.io/articles/dfb-characterization-workflow</guid>
      <pubDate>Tue, 19 May 2026 00:00:00 GMT</pubDate>
      <description>Complete characterization workflow for a distributed-feedback (DFB) semiconductor laser, integrating LIV, spectral, temperature-dependent, and noise measurements to extract the parameters required for telecom and sensing applications.</description>
      <category>Workflow · Laser characterization</category>
    </item>
    <item>
      <title>Optical Spectrum Analyzers: Operating Principles and Measurement Configuration</title>
      <link>https://photonica.io/articles/optical-spectrum-analyzer-fundamentals</link>
      <guid isPermaLink="true">https://photonica.io/articles/optical-spectrum-analyzer-fundamentals</guid>
      <pubDate>Mon, 18 May 2026 00:00:00 GMT</pubDate>
      <description>Reference for optical spectrum analyzers (OSAs) including diffraction grating, Fabry-Pérot, and Fourier-transform variants, resolution bandwidth and dynamic range specifications, and the standard measurement configurations for laser source characterization, OSNR measurement, and EDFA gain characterization.</description>
      <category>Reference · Instrumentation</category>
    </item>
    <item>
      <title>Wall-Plug Efficiency from LIV Measurements</title>
      <link>https://photonica.io/articles/wall-plug-efficiency-from-liv</link>
      <guid isPermaLink="true">https://photonica.io/articles/wall-plug-efficiency-from-liv</guid>
      <pubDate>Sun, 17 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for computing wall-plug efficiency (electrical-to-optical conversion efficiency) of a semiconductor laser from LIV data, with discussion of peak operating point, comparison with internal and external quantum efficiencies, and typical values across device classes.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Setting Up a Temperature-Controlled Laser Characterization Bench</title>
      <link>https://photonica.io/articles/laser-characterization-bench-setup</link>
      <guid isPermaLink="true">https://photonica.io/articles/laser-characterization-bench-setup</guid>
      <pubDate>Sat, 16 May 2026 00:00:00 GMT</pubDate>
      <description>Equipment selection, thermal mounting, electrical configuration, and noise mitigation for a benchtop laser diode characterization setup, with focus on the configuration choices that determine measurement quality.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Active Fiber Alignment to Edge Couplers on Photonic Integrated Circuits</title>
      <link>https://photonica.io/articles/edge-coupler-alignment</link>
      <guid isPermaLink="true">https://photonica.io/articles/edge-coupler-alignment</guid>
      <pubDate>Fri, 15 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for alignment of optical fiber to edge coupler structures on photonic integrated circuits using lensed fibers and inverse-taper couplers, with discussion of butt-coupling, anti-reflection cleaving, and the distinct failure modes compared to grating coupler alignment.</description>
      <category>Procedure · PIC characterization</category>
    </item>
    <item>
      <title>Pulsed versus Continuous-Wave LIV Measurement: Self-Heating and Methodology</title>
      <link>https://photonica.io/articles/pulsed-vs-cw-liv-measurement</link>
      <guid isPermaLink="true">https://photonica.io/articles/pulsed-vs-cw-liv-measurement</guid>
      <pubDate>Thu, 14 May 2026 00:00:00 GMT</pubDate>
      <description>Comparison of pulsed and continuous-wave measurement modes for semiconductor laser LIV characterization, with quantification of self-heating bias, duty cycle requirements, and equipment configuration.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Threshold Current Extraction Methods Compared</title>
      <link>https://photonica.io/articles/threshold-extraction-methods</link>
      <guid isPermaLink="true">https://photonica.io/articles/threshold-extraction-methods</guid>
      <pubDate>Wed, 13 May 2026 00:00:00 GMT</pubDate>
      <description>Comparison of the four standard methods for extracting threshold current from a semiconductor laser LIV curve, applied to a single dataset, with discussion of when each method is preferred and the systematic differences between them.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>M² Beam Quality Measurement by the Knife-Edge Method</title>
      <link>https://photonica.io/articles/m2-beam-quality-measurement</link>
      <guid isPermaLink="true">https://photonica.io/articles/m2-beam-quality-measurement</guid>
      <pubDate>Tue, 12 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for measuring the M² beam quality parameter of a laser beam using the knife-edge method per ISO 11146-1, including hyperbolic fitting, the D4σ width definition, and the dominant sources of measurement error.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Relative Intensity Noise Measurement of Semiconductor Lasers</title>
      <link>https://photonica.io/articles/rin-measurement</link>
      <guid isPermaLink="true">https://photonica.io/articles/rin-measurement</guid>
      <pubDate>Mon, 11 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for measuring relative intensity noise (RIN) of a semiconductor laser using direct detection and an electronic spectrum analyzer, including shot-noise calibration, detector and electronic noise subtraction, and common measurement errors.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Loaded and Intrinsic Q Factor Extraction from Ring Resonator Transmission Spectra</title>
      <link>https://photonica.io/articles/ring-resonator-q-extraction</link>
      <guid isPermaLink="true">https://photonica.io/articles/ring-resonator-q-extraction</guid>
      <pubDate>Sun, 10 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for extracting loaded and intrinsic quality factors of integrated ring resonators from measured transmission spectra, including fit methodology, the all-pass / add-drop distinction, and resolution of the coupling regime ambiguity.</description>
      <category>Procedure · PIC characterization</category>
    </item>
    <item>
      <title>Waveguide Propagation Loss by the Cutback Method</title>
      <link>https://photonica.io/articles/cutback-propagation-loss</link>
      <guid isPermaLink="true">https://photonica.io/articles/cutback-propagation-loss</guid>
      <pubDate>Sat, 09 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for measuring optical propagation loss in integrated photonic waveguides using the cutback method, including paired-device variants used in foundry process control, fit methodology, and uncertainty analysis.</description>
      <category>Procedure · PIC characterization</category>
    </item>
    <item>
      <title>Slope Efficiency and Differential Quantum Efficiency from LIV Measurements</title>
      <link>https://photonica.io/articles/slope-efficiency-extraction</link>
      <guid isPermaLink="true">https://photonica.io/articles/slope-efficiency-extraction</guid>
      <pubDate>Fri, 08 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for extracting slope efficiency and external differential quantum efficiency from laser diode LIV data, with discussion of measurement geometry, facet-collection considerations, and common extraction errors.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Characteristic Temperature Extraction from LIV Measurements</title>
      <link>https://photonica.io/articles/extracting-t0-from-liv-measurements</link>
      <guid isPermaLink="true">https://photonica.io/articles/extracting-t0-from-liv-measurements</guid>
      <pubDate>Thu, 07 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for extracting the characteristic temperature T₀ of a semiconductor laser diode from temperature-dependent threshold current measurements, with worked example and discussion of extraction errors.</description>
      <category>Procedure · Laser characterization</category>
    </item>
    <item>
      <title>Active Fiber Alignment to Surface Grating Couplers</title>
      <link>https://photonica.io/articles/first-light-grating-coupler-alignment</link>
      <guid isPermaLink="true">https://photonica.io/articles/first-light-grating-coupler-alignment</guid>
      <pubDate>Tue, 05 May 2026 00:00:00 GMT</pubDate>
      <description>Procedure for obtaining initial optical coupling between a single-mode fiber and a surface grating coupler on a silicon photonic integrated circuit, including equipment requirements, search algorithm, expected losses, and common failure modes.</description>
      <category>Procedure · PIC characterization</category>
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