LIV curve
Light–current–voltage characteristic — simultaneous measurement of optical output power and forward voltage across a laser diode as a function of drive current.
The LIV (also L–I–V or P–I–V) measurement is the standard characterization of a semiconductor laser diode. Drive current is stepped through a range while two quantities are recorded simultaneously:
- L (or P) — optical output power, measured with a calibrated photodetector, integrating sphere, or optical power meter
- V — forward voltage across the diode terminals, measured by 4-wire (Kelvin) sense to eliminate lead resistance contamination
From a single-temperature LIV curve, multiple parameters can be extracted:
- Threshold current from the L vs. I curve
- Slope efficiency from the linear region above threshold
- Series resistance from the slope above threshold
- Wall-plug efficiency at any operating point
- Turn-on voltage from the V–I knee
Temperature-dependent LIV (LIV-vs-T) datasets additionally yield the characteristic temperature and the differential efficiency temperature coefficient .
Standard measurement configuration:
| Function | Component | Specification |
|---|---|---|
| Current source | SMU or pulsed current driver | resolution; pulsed at duty cycle for high-power devices |
| Voltage measurement | 4-wire Kelvin sense | μV resolution |
| Optical detection | Calibrated photodetector or integrating sphere | Linear over the lasing power range |
| Temperature control | TEC with thermistor on submount | K stability |
For continuous-wave operation at currents above , self-heating of the active region biases the measurement. Pulsed operation at % duty cycle eliminates the bias and is required for accurate high-power LIV characterization.