Density of states (DOS)

The number of allowed quantum states per unit energy per unit volume in a semiconductor band. Determines carrier concentration, gain spectrum, absorption shape, and many other observable properties.

Optics fundamentalsUpdated October 2026

The density of states (DOS) is the number of quantum states per unit energy per unit volume available to electrons (or holes) in a given energy band. It is one of the most fundamental quantities in semiconductor physics, governing carrier concentration, gain spectrum, absorption shape, and the temperature dependence of nearly every device parameter.

Definition. Per unit volume per unit energy:

g(E)  =  dNdE⋅V,

where N is the total number of states in the band up to energy E, and V is the volume.

Bulk (3D) semiconductor DOS. For parabolic bands with effective mass m∗:

g3D(E)  =  12π2(2m∗ℏ2)3/2E−Ec,

for electrons, with a similar form for holes. The DOS rises as E above the band edge.

Effective DOS. Integrating over the Maxwell-Boltzmann tail gives the effective DOS at the band edge:

Nc  =  2(2πme∗kBTh2)3/2,

with similar formula for Nv (valence band). These quantities appear in the carrier concentration formulas:

n  =  Ncexp⁡[−(Ec−EF)/kBT]

(in the non-degenerate limit).

Standard Nc and Nv values at 300 K:

MaterialNc (cm⁻³)Nv (cm⁻³)
Si2.8×10191.04×1019
Ge1.0×10195.0×1018
GaAs4.7×10177.0×1018
InP5.7×10171.1×1019
InGaAs (LM to InP)2.1×10177.7×1018
GaN2.6×10184.6×1019

The much smaller Nc in direct-gap III-Vs reflects their light electron effective mass, relevant for high-mobility electron transport and modest degeneracy thresholds.

2D DOS (quantum well). For a quantum well of thickness Lz, the DOS becomes a staircase:

g2D(E)  =  m∗πℏ2Lz∑nΘ(E−En)

per unit volume, where En=(nπℏ)2/(2m∗Lz2) are the confined subband energies and Θ is the Heaviside step function. Each subband contributes a constant DOS independent of energy within that subband.

The step heights are:

g2D,n  =  m∗πℏ2Lz.

For GaAs (me∗=0.067me): g2D,n=2.8×1013 cm⁻²·eV⁻¹ per subband per area, or 2.8×1019 cm⁻³·eV⁻¹ if Lz=10 nm.

1D DOS (quantum wire). For a 1D confined structure:

g1D(E)  ∝  (E−En)−1/2,

with singularities at each 1D subband edge.

0D DOS (quantum dot). Discrete delta-function levels:

g0D(E)  ∝  ∑nδ(E−En).

A perfect QD has discrete atomic-like states; in practice, inhomogeneous broadening from QD size distribution gives broadened (but still very narrow) DOS.

Why dimensionality matters for lasers. The "joint" DOS (electron and hole) for optical transitions:

DimensionalitygJ(E) near band edgeImplications
3D bulk∝(E−Eg)1/2Soft gain peak, wide spectrum
2D QWStep functionSharper peak, better thermal stability
1D wire∝(E−En)−1/2Even sharper, predicted lower threshold
0D QDDelta functionsNarrowest peak, lowest theoretical threshold

The progression toward lower dimensionality was a major theme in semiconductor laser research from the 1970s through the 2000s. QW lasers replaced bulk lasers in the 1980s; QD lasers (using self-assembled InAs/GaAs QDs) achieve very narrow gain peaks and are commercialized in some applications.

Joint density of states. For optical absorption (or stimulated emission), the relevant quantity combines conduction and valence band DOS at conserved momentum:

gJ(hν)  =  12π2(2mr∗ℏ2)3/2hν−Eg,

where mr∗=me∗mh∗/(me∗+mh∗) is the reduced effective mass. The absorption coefficient is:

α(hν)  ∝  gJ(hν)⋅∣M∣2,

with ∣M∣2 the optical matrix element.

DOS in heavily doped semiconductors. At high doping (ND>Nc), the Fermi level enters the conduction band, the semiconductor becomes degenerate, and band-filling becomes important. The Burstein-Moss shift moves the apparent optical band edge to higher energy:

ΔEBM  =  ℏ2(3π2n)2/32me∗.

For GaAs at n=2×1019 cm⁻³ this parabolic-band estimate gives ΔEBM≈0.4 eV, the rise of the Fermi level above the band edge. A vertical transition at the Fermi wavevector also starts below the valence-band maximum, which multiplies the shift by (1+me∗/mh∗), about 13 % more for heavy holes; conduction-band nonparabolicity and bandgap renormalization make the measured blue-shift smaller.

DOS-based formulas for carrier statistics.

n  =  ∫Ec∞g(E)f(E) dE,

where f(E) is the Fermi-Dirac distribution. For non-degenerate semiconductors, the Maxwell-Boltzmann approximation gives the simple n=Ncexp⁡[−(Ec−EF)/kBT] form. For degenerate semiconductors (laser active regions, modulation-doped 2DEGs), the full Fermi-Dirac integral is needed:

n  =  NcF1/2(η),η=(EF−Ec)/kBT,

with F1/2 the Fermi-Dirac integral of order 1/2.

DOS in van Hove singularities. Critical points in the band structure (saddle points, band extrema) produce singularities in the DOS:

Critical pointDOS behavior
3D minimum or maximumE−Ec or Ev−E
3D saddle pointSquare-root kink (divergent derivative)
2D minimum or maximumStep
2D saddle pointLogarithmic divergence
1D minimum or maximum1/E−Ec

These van Hove singularities are visible in measured photoluminescence and absorption spectra and provide direct evidence for crystallographic band structure.

References: Saleh & Teich, Fundamentals of Photonics (3rd ed., 2019), Ch. 16; Coldren, Corzine & Mašanović, Diode Lasers and PICs (2nd ed., 2012), Ch. 4 for laser-relevant DOS treatment; Yu & Cardona, Fundamentals of Semiconductors (4th ed., 2010), Ch. 6 (canonical band-structure and DOS analysis); Sze & Ng, Physics of Semiconductor Devices (3rd ed., 2007), Ch. 1.

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